Facilities
An overview of available facilities
| Title | Contact | Modality | Description | |
|---|---|---|---|---|
|
FleX-ray scanner | X-ray microCT | Versatile microCT scanner. | |
| JEOL NeoARM (S)TEM | Electron microscopy | Atomic-resolution (S)TEM (0.082 nm STEM, 0.14 nm TEM) with Cs correction and CFEG. Unique features: IDES laser incoupling (NKT supercontinuum, 400–840 nm, tunable repetition rate) with synchronized ns beam blanking, ASI Timepix3 4D-STEM event-driven detector, wide-gap pole piece for a broad range of in situ holders, and EDX. Open-access facility for academic and industrial users. | ||
| FEI Helios Nanolab 600 (SEM/FIB) | Electron microscopy | Dual-beam SEM with Ga focused ion beam and gas injectors (Pt, C, SiO₂ deposition; XeF₂ enhanced etch) for nanofabrication and cross-sectioning. | ||
| FEI Verios 460 | Electron microscopy | High-resolution SEM (nm-scale) with EDS, EBSD, STEM-in-SEM detector, monochromator for low energy spread (<0.2 eV), and a homebuilt EBIC detector. |
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